Showing results: 31 - 45 of 56 items found.
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ITC57300 -
Integrated Technology Corp.
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Precision Milimeter Wave
Microwave and millimeter wave power amplifiers offer a wide variety of frequency ranges, bandwidths, gain and power outputs. Power amplifiers are used to convert low power signals to high power signals in the device. These are typically used in the Tx chain to amplify the signal before it is sent out via an antenna signal.Example specification in test data will be. Frequency, Small Signal Gain (dB), Output P1dB (dBm), Output Saturated Power, Amplifier Bias, Heat Sink Fan Bias, Maximum RF Input Power.If you are looking for RF Power Amplifiers we have the production capabilities to meet your needs.
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AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, programmable power module system providing DC, AC and electronic load assets all under control of a single controller. ReFlex Power™ (RFP™) provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test.
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Maury Microwave Corporation
Maury’s line of diplexers (DP-series) and triplexers (TP-series) are designed for applications which require combining/ splitting signals at or around harmonic frequencies (nFo) and are connectorized for design-in and test and measurement applications.DP-series diplexers are designed using low-pass and high-pass filters and pass bias between the low-frequency (or Fo) port and the common (or DUT) port.TP-series triplexers are designed using low-pass, bandpass and high-pass filters and pass bias between the low-frequency (or Fo) port and the common (or DUT) port.Power handling is rated at 100W CW (average) and typical insertion loss is better than 0.5dB between the low-pass (Fo) and common ports.DP- and TP-series multiplexers are ideal accessories for passive, active and hybrid-active multi-harmonic load pull systems.
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IA1021 -
MINPU TECHNOLOGY CO., LTD.
Feature Specifications: Dual test mode: Analyzer(frequency sweep) and LCR(single frequency).Measurement frequency: 20Hz to 10MHz, 6 digitsFrequency resolution: 0.001% in all frequency rangeFrequency accuracy: 0.01%.DC bias(program): -10V ~ +10V, 0.005V resolution, accuracy 0.5%.Measurement basic accuracy: Impedance +-0.2%, phase: +-0.1°.Display Range: Z: 0.0000Ω-99.999MΩ.
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11022/11025 -
Chroma Systems Solutions, Inc.
0.1% basic accuracyTransformer test parameters (11025), Turns Ratio, DCR, Mutual Inductance0Hz, 60Hz, 100Hz, 120Hz, 1kHz, 10kHz, 20kHz, 40kHz, 50kHz, 100kHz test frequencies21ms measurement time (≥100Hz)Agilent 4263B LCR Meter commands compatible4 different output resistance modes selectable for non-linear inductor and capacitor measuringHigh resolution in low impedance(0.01mΩ) and high accuracy 0.3% till 100mΩ rangeAdjustable DC bias current up to 200mA (constant 25Ω) (11025)1320 Bias Current Source directly control capability0.01mΩ ~ 99.99MΩ wide measurement range (4 1/2 digits)Dual frequency function (11022 option) for automatic productionBIAS comparator functionComparator function and 8/99 bin-sorting functionPass/fail judge result for automatic productionHandler interface trigger edge (rising/falling) programmableTest signal level monitor functionStandard RS-232, GPIB, and Handler I/FOpen/short zeroing, load correctionLabView® Driver
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E5061B -
Keysight Technologies
Select the best configuration for your test needs from a wide variety of test set options: 100 kHz to 1.5 GHz/ 3 GHz, 2-port, 50 or 75 ohm, transmission/reflection or S-parameter test set Address a broad range of applications with the LF-RF option (Option 3L5/3L4/3L3): 5 Hz to 3 GHz, 2-port, 50 ohm, S-parameter test set, gain-phase test port, built-in DC bias source Combine network analysis and impedance analysis to customize your application in a single instrument (Option3L5/3L4/3L3 plus 005) Every spec verified, adjustments included Lock in support & peak performance from the start
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Model 4300R -
Aplab Limited
Aplab Precision LCR Meter Model 4300R is a new generation of impedance test equipment with high accuracy, wide measurement range and six digits resolution. Being featured with test frequency up to 300kHz, test voltage of 5mV ~ 2V, built-in -5V ~ 5V DC bias and -10V~10V DC voltage source output, it can meet all requirements for measuring components and materials and provide guarantees for production line quality assurance, incoming inspection and laboratory precision measurements. The Handler, RS232C and GPIB interfaces as well as improved command system provided by the instrument make it easier to build the test system.
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Part No. KD44CF -
Teledyne Defense Electronics Relays & Coax Switch
The KD44CF solid-state relay utilizes MIL-PRF-28750 test methods. These relays feature fully floating power FET outputs that allow the load to be connected to either output terminal and provides a low ON resistance. A trip status indicator turns on when an overcurrent condition has occurred and the short-circuit protection has been activated.MSL 1 Available options include:KD44CF 2Adc, 60Vdc Load; 3.8-32Vdc (bias voltage), 250µA (CMOS) Control;
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Quantum SMART Fixture -
Accel-RF Corporation
Accel-RF Corporation, the world leader in turnkey RF automated reliability test instruments, has "unplugged" the industry-leading RF SMART Fixture from their automated test platform and made it available for benchtop test. The NEW Quantum SMART Fixture is a programmable self-contained DC bias and RF stimulus control module capable of synchronizing sequenced independent pulsed-bias and pulsed-RF signals to a DUT or remote fixture. The signals are controlled from a user interface compatible with Accel-RF's LIFETEST software. The Quantum SMART fixture is capable of "active" temperature control and monitoring of a remote DUT through embedded firmware in the microprocessor
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Chroma ATE Inc.
Test and packing speeds from 80ppm to1,800ppmStandard functions - Inductance/quality factor test - Winding resistance test - Polarity testOptional functions - Layer short test - Insulation resistance test - Bias current testCircular vibrating plate design feeds inductors steadily and rapidlyIndex disc design eliminates dropped inductorsFour-wire measurement test socket designAutomatic discharge mechanism when feeding errors occurEach test station has an independent NG (No Good) product collection boxTest without packaging function provided, good products gathered in bulk collection boxExclusive data collection software designed for monitoring product quality in real timeReserved stations for number spraying and automatic optical inspectionSwitchable Chinese/English/Japanese operating interfaceEquipment is fast, stable and safe
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Fairview Microwave Inc.
Fairview Microwave’s line of coaxial packaged zero bias Schottky detectors feature matched inputs for excellent VSWR, voltage sensitivity levels that range from 100 to 500 mV/mW for small signal detection, negative video output polarity, and can withstand maximum input power levels up to +20 dBm CW. Operating temperature range covers 0°C to +90°C and storage temperature of -65°C to +125°C. These zero bias Schottky detectors utilize compact cylindrical package outlines that are made of passivated stainless steel and offer a variety of popular input/output SMA and BNC connector configurations that make them ideal for use with precision test and measurement, instrumentation, and subsystems assemblies. Numerous applications include power measurement, leveling pulsed signal sources, AM noise measurements, radar or missile guidance systems, monitoring system level performance, and pulsed RF measurements.
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DC1000A -
Voltech
To guarantee the quality and performance of inductive components such as inductors, chokes and transformers they are tested at their real-life operating point. If the inductor is designed to carry a DC current, then its inductance must be measured with that DC current present. Until now, these measurements were made by an LCR meter connected via special interfacing to a DC bias supply available only from the manufacturer of the LCR meter. The unique NEW DC1000A can be used with any precision LCR meter and connects simply into existing test fixturing.
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Arroyo Instruments
Arroyo Instruments offers a broad range of laser drivers to meet your exact test needs. From 100 milliamps to 100 Amps, all of Arroyo Instruments' LaserSource benchtop laser drivers include unique features not found on competing products such as optically isolated photodiode and modulation inputs, programmable PD bias, and both RS232 and USB computer interfaces. The LaserSource also has laser diode protection circuits such as interlock, ESD protection, and hardware limits for current and voltage.
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ASTM D257 -
National Technical Systems
These test methods cover direct-current procedures for the measurement of dc insulation resistance,volume resistance, and surface resistance. From such measurements and the geometric dimensions of specimen and electrodes, both volume and surface resistivity of electrical insulating materials can be calculated, as well as the corresponding conductances and conductivities. These test methods are not suitable for use in measuring the electrical resistance/conductance of moderately conductive materials. Use Test Method D4496 to evaluate such materials. This standard describes several general alternative methodologies for measuring resistance (or conductance). Specific materials can be tested most appropriately by using standard ASTM test methods applicable to the specific material that define both voltage stress limits and finite electrification times as well as specimen configuration and electrode geometry. These individual specific test methodologies would be better able to define the precision and bias for the determination.
